Shenzhen Zhijianeng Automation Co., Ltd. Shenzhen Zhijianeng Automation Co., Ltd.
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Semiconductor Precision Testing Eqpt

Semiconductor Precision Testing Eqpt

Wafer Surface Inspection System

Wafer Surface Inspection System

The micro-optical solution is mainly used to detect and measure μm-level cosmetic defects on wafers.
  • 98%

    Defect Detection Rate

  • 1.5um

    Accuracy of Defect Determination

  • 80PCS/H

    Capacity UPH

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Mini LED Automatic Rework System

Mini LED Automatic Rework System

Functions: Rejecting, cleaning, tin-assisting, crystal fixing, curing.
  • 100PCS/H

    Capacity UPH

  • ±5um

    Positioning Accuracy

  • ±3℃

    Temperature Control Accuracy

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